Depth-profiling via X-Ray photoemission and Auger spectroscopies of N + implanted tungsten carbides grown on the Ti-6Al-4V alloy

Author: Laidani N.   Dorigoni C.   Miotello A.   Calliari L.   Scarel G.   Sancrotti M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.317, Iss.1, 1998-04, pp. : 477-480

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Abstract