Reflectance anisotropy spectroscopy and the growth of low-dimensional materials

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.318, Iss.1, 1998-04, pp. : 140-147

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Low-Dimensional Approximations of Multiscale Epitaxial Growth Models for Microstructure Control of Materials

By Raimondeau S. Vlachos D.G.

Journal of Computational Physics, Vol. 160, Iss. 2, 2000-05 ,pp. : 564-576

Academic Press

Access to resources Recommend Favorite

Real time monitoring of layer growth on planetary reactor ( R) by reflectance-anisotropy-spectroscopy

By Habets N. Schmitt T. Deufel M. Lunenburger M. Heuken M. Juergensen H.

Thin Solid Films, Vol. 409, Iss. 1, 2002-04 ,pp. : 43-45

Elsevier

Access to resources Recommend Favorite

Principles of Controlled Exposure in Semiconductor Materials Science of Low-Dimensional Systems

Materials Science Forum, Vol. 2016, Iss. 843, 2016-03 ,pp. : 151-154

Trans Tech Publications

Access to resources Recommend Favorite

MBE-growth of heteropolytypic low-dimensional structures of SiC

By Fissel A. Kaiser U. Schroter B. Krauszlich J. Richter W.

Thin Solid Films, Vol. 380, Iss. 1, 2000-12 ,pp. : 89-91

Elsevier

Access to resources Recommend Favorite

Low-dimensional BEC

By Sevilla F.J. Grether M. Fortes M. de Llano M. Rojo O. Solís M.A. Valladares A.A.

Journal of Low Temperature Physics, Vol. 121, Iss. 5-6, 2000-12 ,pp. : 281-286

Springer Publishing Company

Access to resources Recommend Favorite