Quantitative analysis of strain field in thin films from HRTEM micrographs

Author: Snoeck E.   Warot B.   Ardhuin H.   Rocher A.   Casanove M.J.   Kilaas R.   Hytch M.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.319, Iss.1, 1998-04, pp. : 157-162

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Abstract