Logarithmic dependence of the surface anisotropy on the low-angle X-ray diffraction intensity in Co-based multilayers

By Kim J.-H.   Shin S.-C.  

Thin Solid Films, Vol. 301, Iss. 1, 1997-06 ,pp. : 249-252

Elsevier

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Structural study of Ni 80 Fe 20 /Cu multilayers by X-ray diffraction

By Xu M.   Chai C.   Luo G.   Yang T.   Mai Z.   Lai W.  

Thin Solid Films, Vol. 375, Iss. 1, 2000-10 ,pp. : 205-209

Elsevier

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X-ray diffraction investigations of structural changes in Co/Cu multilayers at elevated temperatures

By Hecker M.   Pitschke W.   Tietjen D.   Schneider C.M.  

Thin Solid Films, Vol. 411, Iss. 2, 2002-05 ,pp. : 234-239

Elsevier

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X-Ray diffraction measurement of the Poisson's ratio in Mo sublayers of Ni/Mo multilayers

By Villain P.   Renault P.-O.   Goudeau P.   Badawi K.F.  

Thin Solid Films, Vol. 406, Iss. 1, 2002-03 ,pp. : 185-189

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New application of classical X-ray diffraction methods for epitaxial film characterization

By Peterse W.J.A.M.   Steinfort A.J.   Scholte P.M.L.O.   Tuinstra F.  

Thin Solid Films, Vol. 289, Iss. 1, 1996-11 ,pp. : 49-53

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