![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Reichling M. Bodemann A. Kaiser N.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.320, Iss.2, 1998-05, pp. : 264-279
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Belli R.
Applied Physics A, Vol. 92, Iss. 1, 2008-07 ,pp. :