Stability and transport properties of microcrystalline Si 1-x Ge x films

Author: Edelman F.   Raz T.   Komem Y.   Stolzer M.   Werner P.   Zaumseil P.   Osten H.-J.   Griesche J.   Capitan M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.337, Iss.1, 1999-01, pp. : 152-157

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract