![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Pesty O. Canet P. Lalande F. Seguin J.L. Carchano H.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.337, Iss.1, 1999-01, pp. : 184-187
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Shin C.-S. Kim Y.-W. Gall D. Greene J.E. Petrov I.
Thin Solid Films, Vol. 402, Iss. 1, 2002-01 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
On the morphology of Sb-doped GaAs layers grown by MOVPE
By Yakimova R. Paskova T. Trifonova E.P.
Thin Solid Films, Vol. 265, Iss. 1, 1995-09 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Structural properties of MBE grown GaMnAs layers
By Sadowski J. Domagala J.Z. Bak-Misiuk J. Kolesnik S. Swiatek K. Kanski J. Ilver L.
Thin Solid Films, Vol. 367, Iss. 1, 2000-05 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Microstructure of GaN layers grown on Si(111) revealed by TEM
By Dobos L. Pecz B. Feltin E. Beaumont B. Gibart P.
Vacuum, Vol. 71, Iss. 1, 2003-05 ,pp. :