On ageing and critical thickness of YBa 2 Cu 3 O 7 films on Si with CeO 2 /YSZ buffer layers

Author: Tian Y.J.   Linzen S.   Schmidl F.   Matthes A.   Schneidewind H.   Seidel P.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.338, Iss.1, 1999-01, pp. : 224-230

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content