Author: Brugger A. Schoppmann C. Schurr M. Seidl M. Sipos G. Hahn C.Y. Hassmann J. Waldmann O. Voit H.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.338, Iss.1, 1999-01, pp. : 231-242
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Abstract
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