An X-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices

Author： Temst K.   Van Bael M.J.   Van Haesendonck C.   Bruynseraede Y.   de Groot D.G.   Koeman N.   Griessen R.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.342, Iss.1, 1999-03, pp. : 174-179

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