High-reflectivity Bragg gratings fabricated by 248-nm excimer laser holographic ablation in thin Ta₂O₅ films overlaid on glass waveguides

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Applied Physics A, Vol. 79, Iss. 4-6, 2004-09 ,pp. : 1093-1096

Springer Publishing Company

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Investigation of reversible and irreversible polarizations in thin films of SrBi 2 (Ta 0.5 ,Nb 0.5 ) 2 O 9

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Effects of LaNiO₃ on the structures and properties of SrBi₂Ta₂O₉ thin films

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Properties of thin Ta-N films reactively sputtered on Cu/SiO 2 /Si substrates

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Crystallographic and morphological characterization of reactively sputtered Ta, Ta-N and Ta-N-O thin films

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