Influence of annealing on the surface topography of MgF 2 : An atomic force microscopic study

Author: Ye Y.-H.   Chen P.-P.   Tan X.-L.   Gu N.   Zhang H.-Q.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.346, Iss.1, 1999-06, pp. : 230-233

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Abstract