Author: Hayashi T. Matsumuro A. Muramatsu M. Takahashi Y. Yamaguchi K.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.349, Iss.1, 1999-07, pp. : 199-204
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Growth and mechanical anisotropy of TiN thin films
Thin Solid Films, Vol. 271, Iss. 1, 1995-12 ,pp. :
Comparison of mechanical properties of TiN thin films using nanoindentation and bulge test
Thin Solid Films, Vol. 332, Iss. 1, 1998-11 ,pp. :
Structural characterization of SiC films prepared by dynamic ion mixing
By Zaytouni M. Riviere J.P. Denanot M.F. Allain J.
Thin Solid Films, Vol. 287, Iss. 1, 1996-10 ,pp. :