Ellipsometric characterization and influence of relative humidity on TiO 2 layers optical properties

Author: Alvarez-Herrero A.   Fort A.J.   Guerrero H.   Bernabeu E.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.349, Iss.1, 1999-07, pp. : 212-219

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