Thermal characterization of thin superconducting films by modulated thermoreflectance microscopy

Author: Li B.   Pottier L.   Roger J.P.   Fournier D.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.352, Iss.1, 1999-09, pp. : 91-96

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Abstract