Atomic force microscopy examination of the evolution of the surface morphology of Bi 4 Ti 3 O 12 grown by molecular beam epitaxy

Author: Brown G.W.   Hawley M.E.   Theis C.D.   Yeh J.   Schlom D.G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.357, Iss.1, 1999-12, pp. : 13-17

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Abstract