Simultaneous measurement of spectral optical properties and thickness of an absorbing thin film on a substrate

By Chen J.-J.   Lin J.-D.   Sheu L.-J.  

Thin Solid Films, Vol. 354, Iss. 1, 1999-10 ,pp. : 176-186

Elsevier

Access to resources Recommend Favorite

Film-thickness considerations in microcantilever-beam test in measuring mechanical properties of metal thin film

By Son D.   Jeong J.-h.   Kwon D.  

Thin Solid Films, Vol. 437, Iss. 1, 2003-08 ,pp. : 182-187

Elsevier

Access to resources Recommend Favorite

Micromachined silicon cantilever beams for thin-film stress measurement

By Cardinale G.F.   Howitt D.G.   Clift W.M.   McCarty K.F.   Medlin D.L.   Mirkarimi P.B.   Moody N.R.  

Thin Solid Films, Vol. 287, Iss. 1, 1996-10 ,pp. : 214-219

Elsevier

Access to resources Recommend Favorite

An investigation of the influence of film thickness on the electronic and vibrational properties of trans-polyacetylene thin films

By Graupner W.   Mauri M.   Leditzky G.   Leising G.   Stelzer F.   Fischer W.  

Thin Solid Films, Vol. 259, Iss. 1, 1995-04 ,pp. : 118-129

Elsevier

Access to resources Recommend Favorite

Effects of film thickness and contact load on nanotribological properties of sputtered amorphous carbon thin films

By Ma X.-G.   Komvopoulos K.   Wan D.   Bogy D.B.   Kim Y.-S.  

Wear, Vol. 254, Iss. 10, 2003-07 ,pp. : 1010-1018

Elsevier

Access to resources Recommend Favorite