Optical constants of zinc sulfide films determined from transmittance measurements

By Durrani S.M.A.   Al-Shukri A.M.   Iob A.   Khawaja E.E.  

Thin Solid Films, Vol. 379, Iss. 1, 2000-12 ,pp. : 199-202

Elsevier

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Retrieved optical properties of thin films on absorbing substrates from transmittance measurements by application of a spectral projected gradient method

By Vargas W.E.   Azofeifa D.E.   Clark N.  

Thin Solid Films, Vol. 425, Iss. 1, 2003-02 ,pp. : 1-8

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A method for determining thickness and optical constants of absorbing thin films

By Pekker D.   Pekker L.  

Thin Solid Films, Vol. 425, Iss. 1, 2003-02 ,pp. : 203-209

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Optical characterization of low optical thickness thin films from transmittance and back reflectance measurements

By Laaziz Y.   Bennouna A.   Chahboun N.   Outzourhit A.   Ameziane E.L.  

Thin Solid Films, Vol. 372, Iss. 1, 2000-09 ,pp. : 149-155

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A simple method to determine the optical constants and thicknesses of Zn x Cd 1-x S thin films

By Torres J.   Gordillo G.   Cisneros J.I.   Alvarez F.  

Thin Solid Films, Vol. 289, Iss. 1, 1996-11 ,pp. : 238-241

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