Study of Pt/Ge interaction in a lateral diffusion couple by microbeam Rutherford backscattering spectrometry

Author: Nemutudi R.S.   Comrie C.M.   Churms C.L.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.358, Iss.1, 2000-01, pp. : 270-276

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content