Raman and electroreflectance analysis of internal electric fields in ZnSe

Author: Wagner V.   Becker M.   Weber M.   Fuller T.   Korn M.   Geurts J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.364, Iss.1, 2000-03, pp. : 119-123

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract