![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Harima Y. Yamashita K. Ishii H. Seki K.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.366, Iss.1, 2000-05, pp. : 237-248
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Kelvin probe microscopy measurements of surface potential change under wear at low loads
Wear, Vol. 244, Iss. 1, 2000-08 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Applications of a non-contacting Kelvin probe during sliding
By Kasai T. Fu X.Y. Rigney D.A. Zharin A.L.
Wear, Vol. 225, Iss. 2, 1999-04 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Surface potential measurements using the Kelvin probe force microscope
By Yasutake M. Fujihira M. Aoki D.
Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. :