Characterization of CeO 2 thin films as insulator of metal ferroelectric insulator semiconductor (MFIS) structures

Author： Song H.W.   Lee C.S.   Kim D.G.   No K.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.368, Iss.1, 2000-06, pp. : 61-66

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