Coulomb charging effect of holes in Ge quantum dots studied by deep level transient spectroscopy

Author: Zhang S.-k.   Lu F.   Jiang Z.-m.   Wang X.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.369, Iss.1, 2000-07, pp. : 65-68

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Abstract