Characterization of laterally structured Pb/Ge multilayers

Author: Van Bael M.J.   Moshchalkov V.V.   Bruynseraede Y.   Temst K.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.371, Iss.1, 2000-08, pp. : 80-85

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Abstract