HRTEM study of strained Si/Ge multilayers

Author: Romeo M.   Uhlaq-Bouillet C.   Deville J.P.   Werckmann J.   Ehret G.   Chelly R.   Dentel D.   Angot T.   Bischoff J.L.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.319, Iss.1, 1998-04, pp. : 168-171

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Abstract