![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Romeo M. Uhlaq-Bouillet C. Deville J.P. Werckmann J. Ehret G. Chelly R. Dentel D. Angot T. Bischoff J.L.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.319, Iss.1, 1998-04, pp. : 168-171
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Liu J.L. Wang K.L. Moore C.D. Goorsky M.S. Borca-Tasciuc T. Chen G.
Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Non-linearity of diffusion in amorphous Si-Ge multilayers
By Csik A. Beke D.L. Langer G.A. Erdelyi Z. Daroczi L. Kapta K. Kis-Varga M.
Vacuum, Vol. 61, Iss. 2, 2001-05 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
HRTEM study of Si 1-x Ge x multilayer
By Werckmann J. Ulhaq-Bouillet C. Romeo M. Chelly R. Teodorescu C. Ghica C.
Thin Solid Films, Vol. 294, Iss. 1, 1997-02 ,pp. :