Investigation of ion transportation in high-aspect-ratio holes from fluorocarbon plasma for SiO 2 etching

Author: Noda S.   Ozawa N.   Kinoshita T.   Tsuboi H.   Kawashima K.   Hikosaka Y.   Kinoshita K.   Sekine M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.374, Iss.2, 2000-10, pp. : 181-189

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Abstract