Simple method for determining the optical constants of thin metallic films from transmittance measurements

By Khawaja E.E.   Durrani S.M.A.   Al-Shukri A.M.  

Thin Solid Films, Vol. 358, Iss. 1, 2000-01 ,pp. : 166-171

Elsevier

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Optical characterization of low optical thickness thin films from transmittance and back reflectance measurements

By Laaziz Y.   Bennouna A.   Chahboun N.   Outzourhit A.   Ameziane E.L.  

Thin Solid Films, Vol. 372, Iss. 1, 2000-09 ,pp. : 149-155

Elsevier

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Retrieved optical properties of thin films on absorbing substrates from transmittance measurements by application of a spectral projected gradient method

By Vargas W.E.   Azofeifa D.E.   Clark N.  

Thin Solid Films, Vol. 425, Iss. 1, 2003-02 ,pp. : 1-8

Elsevier

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Determination of optical constants and average thickness of inhomogeneous-rough thin films using spectral dependence of optical transmittance

By Nowak M.  

Thin Solid Films, Vol. 254, Iss. 1, 1995-01 ,pp. : 200-210

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Optical constants of indium tin oxide films as determined by a surface plasmon phase method

By Vaicikauskas V.   Bremer J.   Hunderi O.   Antanavicius R.   Januskevicius R.  

Thin Solid Films, Vol. 411, Iss. 2, 2002-05 ,pp. : 262-267

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