Photoreflectance study of -doped semiconductor layers by a fast Fourier transformation

Author： Nowaczyk M.   Sek G.   Misiewicz J.   Sciana B.   Radziewicz D.   Tlaczala M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.380, Iss.1, 2000-12, pp. : 243-245

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