Probe microanalysis investigation and electroreflectance spectroscopy of Hg 1-x Cd x Te PLD films on silicon patterned substrates

Author: Gorbach T.Y.   Matveeva L.A.   Smertenko P.S.   Svechnikov S.V.   Venger E.F.   Kuzma M.   Wisz G.   Ciach R.   Rakowska A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.380, Iss.1, 2000-12, pp. : 256-258

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Abstract