Growth study of surfactant-mediated relaxed SiGe graded layers for 1.55- m photodetector applications

Author: Liu J.L.   Radetic T.   Tang Y.S.   Teng D.   Jin G.   Luo Y.H.   Wan J.   Gronsky R.   Wang K.L.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.380, Iss.1, 2000-12, pp. : 54-56

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Abstract