Microstructure of semiconducting MnSi 1.7 and -FeSi 2 layers grown by surfactant-mediated reactive deposition epitaxy

Author: Tatsuoka H.   koga T.   Matsuda K.   Nose Y.   Souno Y.   Kuwabara H.   Brown P.D.   Humphreys C.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.381, Iss.2, 2001-01, pp. : 231-235

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Abstract