Optical absorption and electrical conductivity measurements of microcrystalline silicon layers grown by SiF 4 /H 2 plasma on glass substrates

Author: Ambrico M.   Schiavulli L.   Ligonzo T.   Cicala G.   Capezzuto P.   Bruno G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.383, Iss.1, 2001-02, pp. : 200-202

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Abstract