From amorphous to microcrystalline silicon deposition in SiF 4 -H 2 -He plasmas: in situ control by optical emission spectroscopy

Author: Cicala G.   Capezzuto P.   Bruno G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.383, Iss.1, 2001-02, pp. : 203-205

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Abstract