Effect of oxidized Al prelayer for the growth of polycrystalline Al 2 O 3 films on Si using ionized beam deposition

Author: Whangbo S.W.   Choi Y.K.   Jang H.K.   Chung Y.D.   Lyo I.W.   Whang C.N.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.388, Iss.1, 2001-06, pp. : 290-294

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Abstract