The role of the Si-suboxide structure at the interface: an angle-scanned photoelectron diffraction study

Author： Westphal C.   Dreiner S.   Schurmann M.   Senf F.   Zacharias H.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.400, Iss.1, 2001-12, pp. : 101-105

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