Depth-sensitive analysis of a degraded tin oxide electrode surface in a plasma device application

Author: Lemoine P.   Mariotti D.   Maguire P.   McLaughlin J.A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.401, Iss.1, 2001-12, pp. : 196-202

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Abstract