Depth-sensitive strain analysis of a W-Ta-W trilayer

Author: Malhotra S.G.   Rek Z.U.   Yalisove S.M.   Bilello J.C.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.301, Iss.1, 1997-06, pp. : 55-61

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract