In situ resistivity study of copper-cobalt films: precipitation, dissolution and phase transformation

Author: Zhang S.-L.   Harper J.M.E.   Cabral C.   d'Heurle F.M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.401, Iss.1, 2001-12, pp. : 298-305

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Abstract