Author: Habets N. Schmitt T. Deufel M. Lunenburger M. Heuken M. Juergensen H.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.409, Iss.1, 2002-04, pp. : 43-45
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Reflectance anisotropy spectroscopy and the growth of low-dimensional materials
By Sobiesierski Z. Westwood D.I.
Thin Solid Films, Vol. 318, Iss. 1, 1998-04 ,pp. :
150 mm 4H-SiC Epitaxial Layer Growth in a Warm-Wall Planetary Reactor
Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. :