Spontaneous desorption time of flight mass spectrometry for the analysis of chemical reactions in thin solid films of a few monolayers and up to the micrometer regime

Author: Kramer S.   Wohlfart P.   Sterthaus R.   Einsiedel H.   Vydra J.   Mittler S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.411, Iss.2, 2002-05, pp. : 211-218

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content