X-ray diffraction investigations of structural changes in Co/Cu multilayers at elevated temperatures

Author： Hecker M.   Pitschke W.   Tietjen D.   Schneider C.M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.411, Iss.2, 2002-05, pp. : 234-239

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