Author: Vaicikauskas V. Bremer J. Hunderi O. Antanavicius R. Januskevicius R.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.411, Iss.2, 2002-05, pp. : 262-267
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Microstructure study of indium tin oxide thin films by optical methods
By Cui H.-N. Teixeira V. Monteiro A.
Vacuum, Vol. 67, Iss. 3, 2002-09 ,pp. :