Photo-stimulated current spectroscopy and its application in detecting aluminum implantation-induced deep traps in GaN

Author： Xu X.   He H.   Liu H.   Shi C.   Ge W.   Luo E.Z.   Sundaravel B.   Wilson I.H.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.416, Iss.1, 2002-09, pp. : 294-301

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