Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

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Thin Solid Films, Vol. 321, Iss. 1, 1998-05 ,pp. : 86-91

Elsevier

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Lateral ordering of self-assembled Ge islands

By Zhu J.-h.   Brunner K.   Abstreiter G.   Kienzle O.   Ernst F.  

Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. : 252-255

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Formation process and ordering of self-assembled Ge islands

By Miura M.   Hartmann J.M.   Zhang J.   Joyce B.   Shiraki Y.  

Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. : 104-107

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Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si(100) and mixed ODS-DDS/Si(100)

By Brechling A.   Sundermann M.   Kleineberg U.   Heinzmann U.  

Thin Solid Films, Vol. 433, Iss. 1, 2003-06 ,pp. : 281-286

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Coherent growth of InAs/GaAs self-assembled quantum dots

By Santalla S.N.   Kanyinda-Malu C.   de la Cruz R.M.  

Physica E, Vol. 17, Iss. unknown, 2003-04 ,pp. : 480-483

Elsevier

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