Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

Author: Wohl G.   Schollhorn C.   Schmidt O.G.   Brunner K.   Eberl K.   Kienzle O.   Ernst F.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.321, Iss.1, 1998-05, pp. : 86-91

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