Author: Ishihara R. van der Wilt P.C. van Dijk B.D. Burtsev A. Metselaar J.W. Beenakker C.I.M.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.427, Iss.1, 2003-03, pp. : 77-85
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Abstract
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