Angle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2x1-reconstructed Si(100) surfaces

Author： Dreiner S. Westphal C. Schurmann M. Zacharias H.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.428, Iss.1, 2003-03, pp. : 123-128

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