Device characteristics of AlGaAs/InGaAs HEMTs fabricated by inductively coupled plasma etching

Author: Lee J.-H.   Yoon H.-S.   Shim J.Y.   Kim H.-C.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.435, Iss.1, 2003-07, pp. : 139-144

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Abstract