The effect of the amorphous insulator layer on conduction behaviors of the silica/indium tin oxide two-layer films

Author: Kim S.W.   Shin Y.-W.   Bae D.-S.   Lee J.-H.   Kim J.   Lee H.-W.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.437, Iss.1, 2003-08, pp. : 242-247

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Abstract