Infrared optical properties of Bi 2 Ti 2 O 7 thin films by spectroscopic ellipsometry

Author： Hu Z.G. Wang S.W. Huang Z.M. Wang G.S. Zhang Z.H. Lu W. Chu J.H.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.440, Iss.1, 2003-09, pp. : 190-194

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